维普期刊资源整合服务平台（V6.5）

43篇 您的检索式：作者名="TOUBA N A"

选中清除导出查看参考文献查看引证文献引用追踪共3页首页上一页第1页下一页末页 /3 跳转

	题名	作者	年代	出处	被引量
1	Survey of test vector compression techniques显示文摘	Touba N A	2006	Design & Test of Computers2006，23，4：	1
2	An efficient test vector compression scheme using selective Huffman coding 显示文摘	JAS A GHOSH-DASTIDAR J TOUBA N A	2003	IEEE Trans Comp Aid Des2003，22，6：	1
3	Survey of test vector compression tech-niques 显示文摘	TOUBA N A	2006	Design & Test of Computers2006，23，4：	1
4	Improving linear test data compression显示文摘	Balakrishnan K J Touba N A	2006	IEEE Transactions on Very Large Scale IntegrationSystems2006，14，11：	1
5	Using partial isolation rings to test core-based desig ns显示文摘	Touba N A Pouya B	1997	IEEE Design & Test Magazine1997，14，10：	1
6	An efficient test vector compression scheme using selective Huffman coding显示文摘	JAS A GHOSH-DASTIDAR J TOUBA N A	2003	IEEE Trans Comp Aid Des2003，22，6：	1
7	Survey of test vector compression techniques 显示文摘	Touba N A	2006	IEEE Design & Test of Computers2006，23，4：	1
8	Weighted Pseudorandom Hybrid BIST显示文摘	A Jas C V Krishna and N A Touba	2004	IEEE Transactions on Very Large Scale Inte- gration (VLSI) Systems2004，12，12：	1
9	Survey of test vector compression techniques显示文摘	N A Touba	2006	IEEE Design & Test of Computers2006，23，4：	1
10	Achieving high encoding efficiency with partial dynamic LFSR reseeding显示文摘	Krishna C V Jas A Touba N A	2004	ACM Transactions on Design Automation of Electronic Systems2004，9，4：	1
11	Survey of test vector compression techniques 显示文摘	Touba N A	2006	IEEE Design & Test of Computers2006，23，4：	1
12	Survey of test vector compression techniques显示文摘	N A Touba	2006	Design & Test of Computers2006，23，4：	1
13	Survey of test vector compression techniques显示文摘	Touba N A		0，，04：	1
14	Survery of test vector compression teehnique显示文摘	Touba N A	2006	IEEE Design & Test of Computers2006，23，4：	1
15	Weighted pseudo-random hybrid BIST显示文摘	Jas A Krishna C V Touba N A	2004	IEEE Transactions on Very Large Scale Integration Systems2004，12，12：	1
16	Test data compression technique for embedded cores using virtual scan chains 显示文摘	Jas A Pouya B Touba N A	2004	IEEE Transactions on Very Large Scale Integration (VLSI) Systems2004，12，7：	1
17	Guest editors introduction: progress in test compression 显示文摘	DAVIDSON S TOUBA N A	2008	IEEE Design & Test of Computers2008，25，2：	1
18	Survey of test vector compression techniques显示文摘	TOUBA N A		0，，04：	1
19	Bit-frxing in pseudorandom sequences for scan BIST 显示文摘	TOUBA N A McCLUSKEY E J	2001	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems2001，20，4：	1
20	LFSR-reseeding Scheme Achieving Low-power Dissipation During Test显示文摘	Lee J Touba N A	2007	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems2007，26，2：	1

返回顶部每页显示：

共3页首页上一页第1页下一页末页 /3 跳转

互联网出版许可证新出网证(渝)字10号全国400电话 - 免长途话费

用户提示